You are herePRFN2


warning: Use of undefined constant is_null - assumed 'is_null' (this will throw an Error in a future version of PHP) in /var/www/aphys/sites/all/modules/stag/stag.module on line 506.

Course: Instrument. Physics for Nanotechnology 2

Department/Abbreviation: KEF/PRFN2

Year: 2021

Guarantee: 'Mgr. Dalibor Jančík, Ph.D.'

Annotation: Signal processing in measuring technology. Analog technology. Digital technology. A / D converters. D / A converters. Measuring systems (CAMAC, NIM, VXI, etc.). Virtual measuring instruments.

Course review:
1. Construction of measurement and test systems - mechanical, electrical and electronical parts; digital measurement systems - development of programmable controlled systems, measurement instruments, measurement SW. 2. Vacuum technics - measurement of low pressures, vakuum gaining, types of vacuum pumps, methods for leakage testing, low pressure physics, materials, surface preparing. 3. Cryogenic technics - measurement of low temperatures, low tempereture gaining, cryostats (static, flowing, closed cycles), ultralow temperatures, low temperatures physics, cryofluids, superconductivity, superflow. 4. High temperature technics - measurement and reaching, materials, furnaces. 5. High pressure technics - measurement and reaching of high pressures, materials and pressure boxes. 6. Utilization of ionization radiation in research and industry - principles of neutron activation and rtg-flourescence analysis, Mössbauer spectroscopy, defectoscopy. 7 Up-to-date measurement systems in nanoworld - electron microscopy, dynamic light scattering, surface area measurement, nanoporosity.