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Course: Scanning Probe Microscopy and its Appl.

Department/Abbreviation: KEF/PGSSO

Year: 2021

Guarantee: 'doc. RNDr. Roman Kubínek, CSc.'

Annotation: Scanning tunneling microscopy (STM), AFM,l MFM, LFM, SPM, aplications.

  • Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes
  • MFM - Magnetic force microscopy
  • LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques
  • SPM as a surface analytical tool
  • Environment of SPM methods
  • Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips
  • The artifacts of the images
  • Tip convolution effect
  • Feedback artifacts
  • Possibilities of computer image analysis, testing of artifacts
  • Applications of SPM

    Course review:
    Scanning tunneling microscopy (STM) Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes MFM - Magnetic force microscopy LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques SPM as a surface analytical tool Environment of SPM methods Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips The artifacts of the images Tip convolution effect Feedback artifacts Possibilities of computer image analysis, testing of artifacts Applications of SPM