You are herePGSRM

PGSRM

warning: Use of undefined constant is_null - assumed 'is_null' (this will throw an Error in a future version of PHP) in /var/www/aphys/sites/all/modules/stag/stag.module on line 506.

Course: Electron and Raster Probe Microscopy

Department/Abbreviation: KEF/PGSRM

Year: 2021

Guarantee: 'doc. RNDr. Roman Kubínek, CSc.'

Annotation:

  • Scanning tunneling microscopy (STM), AFM. Applications of SPM.

    Course review:

    • Scanning tunneling microscopy (STM)
    • Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes
    • MFM - Magnetic force microscopy
    • LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques
    • SPM as a surface analytical tool
    • Environment of SPM methods
    • Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips
    • The artifacts of the images
    • Tip-surface convolution effect
    • Feedback artifacts
    • Possibilities of computer image analysis, testing of artifacts
    • Applications of SPM