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Course: Nanometrology

Department/Abbreviation: KEF/BNMT

Year: 2020

Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'

Annotation: Students obtain basic information about general metrology and standardization and deeper insight into metrology of nanostructures, especially in the field of length nanometrology.

Course review:
- Metrology, standardization, uncertainty, metrological traceability - Length nanometrology - problems connected with tiny sizes, metrological AFM, standards, evaluation, surface description - Nanometrology of angle, mass, force and other quantities - Quantum etalons of basic physical quantities