APNA2

Course: Applied Nanotechnology 2

Department/Abbreviation: KEF/APNA2

Year: 2011 2012

Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'

Annotation:

• Nanometrology - principles of metrology in the nanoworld, metrological relationship, metrology by scanning probe microscopy and electron microscopy, X-ray interferometry.

  Course review:
  Nanometrology - principles of metrology in the nanoworld, metrological relationship, metrology by scanning probe microscopy and electron microscopy, X-ray interferometry

• Measurements in the nanoworld - applications of electron microscopy and scanning probe microscopy for measurements of material properties, Young modulus, adhesion and for F-d curve, nanoindentation
• Calibration structures - types and production of calibration structures, methods of calibration and their uncertainty
• Nanodevices - MEMS and NEMS (motoric elements, micro-cantilevers), electronic elements (molecular electronics, logic gates, one-electron transistors), application of nanotubes, nanosensors of gases, detectors of light, microfluidal devices, bioapplications

Nanotechnologie jsou v současné době bouřlivě se rozvíjející oblastí vědy. K plnému pochopení jejich problematiky a rozsahu bohužel nestačí učebnice či přednášky, ale je třeba sledovat i aktuální vědecké informace. Proto zde uvádíme vybrané zdroje, které mohou posloužit bližším zájemcům.