You are hereGeneral, Aktuality, Portál, Kontakty, Důležité odkazy, Semináře, Výstupy klíčových aktivit, Akce pro veřenost, CPS2012

General, Aktuality, Portál, Kontakty, Důležité odkazy, Semináře, Výstupy klíčových aktivit, Akce pro veřenost, CPS2012


Lhůta pro podání přihlášek ke studiu sticky icon

Lhůta pro podání přihlášek ke studiu v bakalářských, magisterských a navazujících magisterských studijních programech pro akademický rok 2012/2013 končí 29. února 2012.
Lhůta je zachována, je-li přihláška ke studiu podána k přepravě (odeslána elektronicky) poslední den lhůty.

CPS2012: Call for Papers & Author Guidelines sticky icon

CPS OC 2012 abstracts will be published in the Book of abstracts (ISBN) and full papers in the form of SPIE Proceedings in the electronic format.

Conference papers should be written in English in the range from 6 to 8 pages according to the attached SPIE template. The template is also available on the conference web site.

Authors are supposed to submit their manuscripts to the SPIE using this link: http://spie.org/cps12 before July 31, 2012.

All the papers will be reviewed. Only accepted manuscripts will be published in the SPIE Proceedings.

CPS2012: Scope sticky icon

The Eighteenth Czech-Polish-Slovak Optical Conference (CPS OC) will be held in the Sepetná resort close to Ostravice, Czech Republic. The conference is organized by Joint Laboratory of Optics of Palacky University and Institute of Physics of the Academy of Sciences of the Czech Republic.

Following the long tradition, the CPS OC becomes a well-established forum in the field of wave and quantum optics from three neighboring countries. The meeting will provide an opportunity to highlight recent results of research and development in the field of physics.

Proseminář z matematiky pro fyziky 1 sticky icon

Course: Proseminar in Mathemat. for Physicists 1

Department/Abbreviation: SLO/SMF1

Year: 2011 2012

Guarantee: 'RNDr. Pavel Horváth, Ph.D.'

Annotation: Acquire the basic knowledge of mathematical analysis focused on physics applications.

Course review:
1. Mathematical logic, Mathematical language. 2. Sets, functions. 3. Real numbers. 4. Complex numbers. 5. Combinatorics and fundamentals of statistics. 6. Sequences, limits of sequences, infinite series. 7. Functions - real functions of a single real variable: The basic notions and properties of functions. 8. Elementary functions: Power, exponential, logarithmic, trigonometric and cyclometric functions. 9. Limit and continuity of a function. 10. Fundamentals of differential calculus: Derivative and its geometrical and physical meanings, differential, determination of functions properties. 11. Use of the software MATHEMATICA for selected themes - exercises.

 

Praktikum z experimentálních technik a měřicí metody 2 sticky icon

Course: Pract. in Exp. & Measuring Methods 2

Department/Abbreviation: SLO/PEXT2

Year: 2011 2012

Guarantee: 'Prof. RNDr. Miroslav Hrabovský, DrSc.'

Annotation: The aim is to teach students some modern optical methods in practice applications.

Course review:
1st week: Introduction to the practicum, overview of the laboratory tasks, organization and formal affairs concerning the attendance of the classes and basic experimental elements in the optical experiment, work safety in the practicum and work with lasers

List of topics of the practicum:

  • Analysis of the surface of the materials
    • Measurement of shape and spatial structure of the surface of engineering components and optical elements by means of contact Taylor-Hobson TALYFORM roughness-meter
    • Determination of roughness of the surface of polished components by means of CASI scatterometer
    • Usage of mobile roughness-meter for optimization of technology of optical elements


  • Evaluation of optical elements
    • Optical methods for evaluation of the shape and dimension parameters of mirror surfaces, MEOPTA spherical interferometer
    • Mechanical measuring methods for checking of geometrical shapes of components
    • Optical transmission function, objective method of evaluation of quality of optical systems, EROS measuring device
    • Methods of measurement of reflectivity of optical surfaces and thin layers
    • Measurement by optical goniometer


  • Interferometers for measuring purposes
    • Conditions for generation of interference phenomenon, visibility of interference fringes, measurement of deformation of the surface
    • Types of interferometers and their usage in measuring methods, Michelson interferometer for measurement of small shifts
    • Interference in white light


  • Microscopes
    • Microscope as a tool for measurement of small distances
    • Imaging of the structure of technical surfaces by means of laser confocal OLYMPUS LEXT microscope
    • Universal ZEISS microscope with micro-hardness tester

 

Aplikované nanotechnologie 1 sticky icon

Course: Applied Nanotechnology 1

Department/Abbreviation: KEF/BAPN1

Year: 2011 2012

Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'

Annotation: Physical techniques of formation of nanostructures.

Course review:
Physical techniques of formation of nanostructures - light, electron and X-ray lithography, lithography with ionic and atomic beams, nanoparticle lithography, techniques based on scanning probe microscopy, laser ablation, microcontact printing, LIGA

  • Chemical techniques of formation of nanostructures - heterogeneous and homogeneous nucleation, spontaneous growth, methods of deposition (PVD, CVD, MBE), usage of macromolecules and biomolecules for synthesis of other structures
  • Self-assembling - formation of layers and their applications
  • Imaging techniques for characterization of nanostructures - electron microscopy (SEM, HR TEM, nanotomography), scanning probe microscopy (AFM, MFM, SNOM), atomic probe tomography
  • Techniques for characterization of sizes of nanostructures - application of imaging techniques, usage of light scattering, X-ray diffraction and Mössbauer spectroscopy and measurements of specific surface area
  • Measurements of properties of nanostructures - characterization of a structure by X-ray diffraction and Mössbauer spectroscopy, usage if infrared, ultraviolet and electron spectroscopy, measurements of electric and magnetic properties

  • Lékařská přístrojová technika 2 sticky icon

    Course: Medical Instrumentation 2

    Department/Abbreviation: KEF/LPT2

    Year: 2011 2012

    Guarantee: 'Doc. RNDr. Roman Kubínek, CSc.'

    Annotation:

      Diagnostic methods, diagnostic applications of biopotentials , displaying methods in medical diagnostics, CT, MRI, ultrasound diagnostics, endoscopic diagnostic. Therapeutic methods .

      Course review:
      >

    • Diagnostic methods - definition of biosignal and its role in diagnostic-information system, amplifiers of biopotentials, sensing electrodes, origin, scanning and diagnostic applications of biopotentials (EKG, EMG, EEG), phonocardiography, measurement of blood flow and minute blood volume, pletysmography, measurement of blood pressure and pulse rate, devices for measurement of mechanics of breathing, classical X-ray diagnostic methods (skiascopy, skiagraphy), displaying methods in medical diagnostics, CT, MRI, ultrasound diagnostics (displaying, measuring of blood flow), endoscopic diagnostic (therapeutic) methods (construction of endoscope)
    • Therapeutic methods - defibrillators, cardiac pacemakers, neuromuscular stimulators, urostimulators, gastrostimulators, magnetotherapy, diathermy, ultrasound therapy, treatment by ionization radiation - nuclear medicine, radiotherapy, Leksell gamma knife
    • Surgical methods - kryosurgery, electrotomy and thermocoagulation, ultrasound surgery, applications of impulse waves, lasers and their medical uses
    • Other methods - ventilating and anesthesiological systems, extra-corporeal cardiopulmonary circulation, extra-corporeal renal circulation (haemodialysis, haemofiltration, plasmapherosis), cardiac pacemakers, electrodes, hearing supports

     

    PrezentacePrezentace (ZIP PDF 18 MiB)

    PrezentacePřehledová prezentace (PDF 3,5 MiB)

    Materiály pro Portál moderní fyziky sticky icon

    Šablony pro psaní dokumentů

    • učební a další texty:
    • prezentace:

    Elektronická měření sticky icon

    Course: Electronic Measurements

    Department/Abbreviation: KEF/ELMEA

    Year: 2011 2012

    Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'

    Annotation:

    • Issues of measurements - measuring methods, devices, properties of devices, block scheme of a measuring device, electromechanical and electronic measuring devices, types of signals, capacitive, inductive and resistive coupling, electromagnetic compatibility, principles of correct measurements, basic electronic elements, components and circuits used in measurements

      Course review:
      Issues of measurements - measuring methods, devices, properties of devices, block scheme of a measuring device, electromechanical and electronic measuring devices, types of signals, capacitive, inductive and resistive coupling, electromagnetic compatibility, principles of correct measurements, basic electronic elements, components and circuits used in measurements

    • Measurement of frequency - primary standard of frequency, analogical and digital measurements of frequency, definition of phase, analogical and digital measurements of phase, measurements of time intervals, phase link and frequency synthesis
    • Measurement of voltage - primary and secondary standards of voltage, referential sources, analogical measurements of voltage, properties of A/D converters, digital measurements of voltage, errors of voltage measurements, measurements of voltage ratio, analogical and digital oscilloscopes, logic analyzers, registers and recording devices
    • Measurements of other quantities - analogical and digital measurements of electric current, electric power and electric energy, measurements of resistance, capacitance and inductance, general impedances, bridge methods, measurements of parameters of elements, circuits and systems, measurements of spectra of signals, measurements of nonlinear distortions and measurements of noise
    • Measuring generators - generators of harmonic voltage, functional generators and noise generators