You are hereFZNA2, BAPN1, FZNA1, APNA1, APNA2, ZANAN, KEF/AJF, APEL, MBAS, ELMEA, EMG, FP1, FP2, FP3, FP5, MFT, MMM, PEL, TMN, TSFN, BAPN2, BFZN1, BFZN2, FYB2, FYB1, EXMB1, LPT2, BLP2, ČMS1, TSII1, TSII2, UAA, BLP3, BLP1, PELMA, BNNE
FZNA2, BAPN1, FZNA1, APNA1, APNA2, ZANAN, KEF/AJF, APEL, MBAS, ELMEA, EMG, FP1, FP2, FP3, FP5, MFT, MMM, PEL, TMN, TSFN, BAPN2, BFZN1, BFZN2, FYB2, FYB1, EXMB1, LPT2, BLP2, ČMS1, TSII1, TSII2, UAA, BLP3, BLP1, PELMA, BNNE
Číslicové měřicí systémy 1
Course: Digital Measuring Systems 1
Department/Abbreviation: KEF/ČMS1
Year: 2011 2012
Guarantee: 'RNDr. Jiří Pechoušek, Ph.D.'
Annotation:
- Digital measuring system (computer utilization vs. autonomous device), basic classification and construction, structure.
Course review:
l> - Digital measuring system (computer utilization vs. autonomous device), basic classification and construction, structure (bus, star, circle, tree), centralized/decentralized measuring systems, open/closed measuring systems, laboratory measuring systems, standardization of device interfaces
- Standard interface, RS-232, RS-485, IEEE 488 (GPIB), USB, IEEE 1394 (FireWire), modular systems, industrial systems, VME, VXI, CompactPCI, PXI, PC/104, MXI, device interfaces of industrial measuring systems, Foundation FieldBus, ProfiBus, CAN
- Plug-in measuring cards for PC, virtual instrumentation, multifunctional cards, programme means, VISA controllers, development environment for measurement applications, programming of measuring systems, SCPI standard
- LabVIEW, graphical development environment, principle of VI construction, front panel, block diagram, SubVI, work with variables, programme structures, data types of variables and constants, numbers, strings, arrays, clusters, LabVIEW project, creation of applications, installation procedure
Nanofotonika a nanoelektronika
Course: Nanophotonics and Nanoelectronics
Department/Abbreviation: SLO/BNNE
Year: 2011 2012
Guarantee: 'RNDr. Antonín Fejfar, CSc.'
Annotation: The lecture gives students information about basics of nanophotonics, shows techniques of microscopy in near field and scanning probe microscopes. Next energetic conversion in nanostructures and utilization of nanostructures properties for efficiency increase is explained.
Course review:
- Basics of nanophotonics, spatial restrictions: similarities and differences between photons and electrons, tunneling, localization, interaction with nanostructures for photons (evanescent waves, plasma resonance) and for electrons (quantum mechanical size effect, Coulomb blockade), overview of usage of mentioned phenomena in present and future components for optoelectronics
- Near field and microscopy, principle of microscopy in near optical field or by means of local interaction (electron tunneling, force interaction), usage for study of quantum dots and for spectroscopy of individual molecules, spectroscopy in near field and local enhancement of interaction by means of the tip (e.g. TERS)
- Scanning tip microscopes, scanning tunneling microscopy (STM) and atomic force microscopy (AFM), modification of AMF with the use of other interactions: work function, electrostatic force, magnetic force, measurement with local detection of electric current of capacity
- Energy transformation in nanostructures, basics of photovoltaic phenomenon in classical solar cells, effect limiting the efficiency of photovoltaic transformation, usage of properties of nanostructures for the increase of the efficiency: multiplication of carriers, photon fusion, multiple generation of charge carriers
Laboratorní praxe, projekt 2
Course: Laboratory Training, Project 2
Department/Abbreviation: KEF/BLP2
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation: Laboratory practice in the research and development workplaces of the Department of Experimental Physics, Joint Laboratory of Optics and Centre for Nanomaterial Research.
Course review:
Laboratorní praxe na výzkumných a vývojových pracovištích Katedry experimentální fyziky, Společné laboratoře optiky a Regionálního centra pokročilých technologií a materiálů.
Praktikum z elektronických měření
Course: Practicals in Electronic Measurement
Department/Abbreviation: KEF/PELMA
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation: Basics of electronic measurements, excursion in Vyškov and the laboratories of SLO.
Course review:
<ul>
<li> Basics of measurements - measurements with a multimeter, RMS and TrueRMS voltmeters, measurements of frequency, verification of properties of AD conversion, construction of integrating voltmeter
<li> Serial communication with a computer and measuring device, utilization in simple software programmes
<li> ATMEL AT89C51AC3 microcontroller - distinctions of microcontrollers from microprocessors, block scheme of 8051 microcontroller, extension of particular type, registers, interruptions, counters and times, serial communication, instruction sets, memory organization
<li> Programming of microcontroller - basics of programming in Assembler, compilation in Assembler, physical programming of a microchip, realization of simple functions, uses of sub-programmes and interruptions, realization of digital filter, programming in C language
</ul>
Laboratorní praxe, projekt 1
Course: Laboratory Training, Project 1
Department/Abbreviation: KEF/BLP1
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation: Laboratory practice in the research and development workplaces of the Department of Experimental Physics, Joint Laboratory of Optics and Centre for Nanomaterial Research.
Course review:
Laboratory practice in the research and development workplaces of the Department of Experimental Physics, Joint Laboratory of Optics and Centre for Nanomaterial Research.
According to the project.
Laboratorní praxe, projekt 3
Course: Laboratory Training, Project 3
Department/Abbreviation: KEF/BLP3
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation: Laboratory practice in the research and development workplaces of the Department of Experimental Physics, Joint Laboratory of Optics and Centre for Nanomaterial Research.
Course review:
Laboratory practice in the research and development workplaces of the Department of Experimental Physics, Joint Laboratory of Optics and Centre for Nanomaterial Research.
Aplikované nanotechnologie 2
Course: Applied Nanotechnology 2
Department/Abbreviation: KEF/BAPN2
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation: Nanometrology - principles of metrology in the nanoworld.
Course review:
- Nanometrology - principles of metrology in the nanoworld, metrological relationship, metrology by scanning probe microscopy and electron microscopy, X-ray interferometry
- Measurements in the nanoworld - applications of electron microscopy and scanning probe microscopy for measurements of material properties, Young modulus, adhesion and for F-d curve, nanoindentation
- Calibration structures - types and production of calibration structures, methods of calibration and their uncertainty
- Nanodevices - MEMS and NEMS (motoric elements, micro-cantilevers), electronic elements (molecular electronics, logic gates, one-electron transistors), application of nanotubes, nanosensors of gases, detectors of light, microfluidal devices, bioapplications
Přednáška (PDF 9 MiB)
Aplikované nanotechnologie 1
Course: Applied Nanotechnology 1
Department/Abbreviation: KEF/BAPN1
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation: Physical techniques of formation of nanostructures.
Course review:
Physical techniques of formation of nanostructures - light, electron and X-ray lithography, lithography with ionic and atomic beams, nanoparticle lithography, techniques based on scanning probe microscopy, laser ablation, microcontact printing, LIGA
Základy nanotechnologií
Course: Nanotechnology
Department/Abbreviation: KEF/ZANAN
Year: 2011 2012
Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'
Annotation:
- Introduction to quantum mechanics. Carbon nanostructures . Nanoelectronics .
- Analytical measuring tools (STM, AFM)
- Application of nanotechnologies
- Risks of nanotechnologies
Course review:
> Introduction to quantum mechanics (theory and consequences)
Lékařská přístrojová technika 2
Course: Medical Instrumentation 2
Department/Abbreviation: KEF/LPT2
Year: 2011 2012
Guarantee: 'Doc. RNDr. Roman Kubínek, CSc.'
Annotation:
-
Diagnostic methods, diagnostic applications of biopotentials , displaying methods in medical diagnostics, CT, MRI, ultrasound diagnostics, endoscopic diagnostic. Therapeutic methods .
- Diagnostic methods - definition of biosignal and its role in diagnostic-information system, amplifiers of biopotentials, sensing electrodes, origin, scanning and diagnostic applications of biopotentials (EKG, EMG, EEG), phonocardiography, measurement of blood flow and minute blood volume, pletysmography, measurement of blood pressure and pulse rate, devices for measurement of mechanics of breathing, classical X-ray diagnostic methods (skiascopy, skiagraphy), displaying methods in medical diagnostics, CT, MRI, ultrasound diagnostics (displaying, measuring of blood flow), endoscopic diagnostic (therapeutic) methods (construction of endoscope)
- Therapeutic methods - defibrillators, cardiac pacemakers, neuromuscular stimulators, urostimulators, gastrostimulators, magnetotherapy, diathermy, ultrasound therapy, treatment by ionization radiation - nuclear medicine, radiotherapy, Leksell gamma knife
- Surgical methods - kryosurgery, electrotomy and thermocoagulation, ultrasound surgery, applications of impulse waves, lasers and their medical uses
- Other methods - ventilating and anesthesiological systems, extra-corporeal cardiopulmonary circulation, extra-corporeal renal circulation (haemodialysis, haemofiltration, plasmapherosis), cardiac pacemakers, electrodes, hearing supports
Course review:
>
Prezentace (ZIP PDF 18 MiB)
Přehledová prezentace (PDF 3,5 MiB)
