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Course: Optics of Thin Films in Techn. Practise

Department/Abbreviation: SLO/TVP

Year: 2020

Guarantee: 'Ing. Jaromír Křepelka, CSc.'

Annotation: The aim consists in the development of idea concerning the propagation of electromagnetic waves in layered optical systems, to determine the measurable parametres of systems composed from thin and/or thick layers and to describe design methods of basic interference filters using analytical and numerical approach.

Course review:
1. Characterisation of thin films - definition of thin film (TF), interference in partially coherent light, basic TF properties, natural examples of TF. 2. Deposition methods - physical and chemical methods, process control, material properties and quality requirements, measurement of TF optical parameters, basics of ellipsometry and its interpretation. 3. Examples of TF applications - antireflection, dielectric reflectors, dichroic filters, narrow-band filters, polarizing splitters, special interference filters. 4. Theoretical elements of TF analysis - calculation of amplitude and radiant reflectivity and transmissivity, demonstration of analysis algorithms and calculated results, meaning of reversibility theorem for macroscopic parameters. 5. Thick layers - methodology of parameters calculation for combination of thin and thick layers. 6. Design methods - half-wave layer, buffer layer, symmetric TF systems, numerical parameters optimisation, demonstration of algorithms and calculations. 7. Properties of single thin film - including one reflective boundary, Brewster angle, total reflection, design of simple antireflection. 8. Design of multiple-layer antireflection. 9. Design of highly reflected TF - with specific stopband width and defined high reflectivity, smoothing of side lobes, optimisation algorithms. 10. Design of MacNeillova polarizator. 11. Design of Fabry-Perot filter.