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PGSOT


Course: Optics of Thin Films

Department/Abbreviation: SLO/PGSOT

Year: 2020

Guarantee: 'Ing. Jaromír Křepelka, CSc.'

Annotation: The aim is to familiarize students with the optical characteristics of systems composed from thin isotropic, homogeneous (and inhomogeneos) layers designed from dielectric and also metal materials including their applications and to understand in more detail the physical principles beyond these systems. The attention is also paid to the propertiesof ideal thick layers and their combinations with thin film systems, and anisotropic layers too. The theory is based on the solution of Maxwell equations for monochromatic plane waves, from which the formulae for transformation of tangential components of electric and magnetic field are derived and measurable macroscopic parameters (reflectivity, transparency, absorbtion) are defined. There are discussed theoretically interesting problems, for instance the reversibility principle, principle of equivalence for symetrical system of layers, the thin film behaviour in partly coherent light field, colour effects within thin films, the relation of thin films to the wave guided structures and the relation of periodical structures to photonic crystals. The examples of practical design problems are solved especially using antireflecting structures, highly reflecting systems, narrow band filters and polarising beam splitters.

Course review:
- Concept of optical thin films, characteristics, basic properties, application examples - Propagation of plane monochromatic waves in the layered medium - Transfer matrix for tangential components of electric and magnetic field components of counter-propagating waves, amplitude reflectivity and transmissivity - Transfer matrix pro the normal component of Poynting vector, radiant reflection and transmission - Reversibility theorem - Properties of one thin layer, thick layer - Description of systems composed from thin and/or thick layers - Layers in partly coherent light - Construction ideas: half-wavelength, buffer layer, symmetrical system of three layers, approximate approaches, powers of interference matrices, derivatives of thin films parameters - Periodical systems of thin films, width of stop-band region,maximal reflectivity - McNeill polarizing prism - Antireflecting thin film systems: one thin layer, two thin layers, maximally flat antireflections, numerical approach - Fabry-Perot interference filters - Induced transmission (transillumination of metal layer) - Basics of ellipsometry - Anisotropic thin films