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OMM
Course: Optical Methods of Measurements
Department/Abbreviation: OPT/OMM
Year: 2020
Guarantee: 'prof. RNDr. Zdeněk Hradil, CSc.', 'RNDr. Ing. Jan Podloucký'
Annotation: Sources and detectors of radiation, basic characteristics of optical systems.
Course review:
- Basic optical elements, devices and instruments of optical measurement laboratory
- Sources and detectors of radiation, photometric quantities, units and measurement.
- Measurement methods of basic parameters of optical materials, refractive index measurement, dispersion, transmissivity
- Measurement of lengths and angles by optical methods, interferometry
- Measurement of form parameters of optical surfaces, radius of curvature, flatness, measurement of aspherical surfaces, evaluation of surface quality
- Basic parameters and constants of optical systems, measurement of focal length, positions of cardinal points
- Basic optical instruments, measurement of magnification, restriction of ray beams, methods of determination of input and output pupil
- Measurement of optical systems quality, resolution, aberration
- Polarization of light, methods for obtaining of polarized light, measurement of polarization state
- Measurement of photometric characteristics of optical materials, elements, components and systems
- Measurement of image quality of optical systems. Point spread function, optical transfer function, modulation transfer function