OMM

Course: Optical Methods of Measurements

Department/Abbreviation: OPT/OMM

Year: 2020

Guarantee: 'prof. RNDr. Zdeněk Hradil, CSc.', 'RNDr. Ing. Jan Podloucký'

Annotation: Sources and detectors of radiation, basic characteristics of optical systems.

Course review:
- Basic optical elements, devices and instruments of optical measurement laboratory - Sources and detectors of radiation, photometric quantities, units and measurement. - Measurement methods of basic parameters of optical materials, refractive index measurement, dispersion, transmissivity - Measurement of lengths and angles by optical methods, interferometry - Measurement of form parameters of optical surfaces, radius of curvature, flatness, measurement of aspherical surfaces, evaluation of surface quality - Basic parameters and constants of optical systems, measurement of focal length, positions of cardinal points - Basic optical instruments, measurement of magnification, restriction of ray beams, methods of determination of input and output pupil - Measurement of optical systems quality, resolution, aberration - Polarization of light, methods for obtaining of polarized light, measurement of polarization state - Measurement of photometric characteristics of optical materials, elements, components and systems - Measurement of image quality of optical systems. Point spread function, optical transfer function, modulation transfer function