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SZZFM


Course: Applied photonics and metrology

Department/Abbreviation: KEF/SZZFM

Year: 2020

Guarantee: 'doc. RNDr. Roman Kubínek, CSc.', 'prof. RNDr. Jan Peřina, Ph.D.'

Annotation: Final exam for verification and evaluation of the level of knowledge.

Course review:
The subject of the exam covers 17 areas and students will be provided with their content.