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Course: Electron and Raster Probe Microscopy

Department/Abbreviation: KEF/PGSRM

Year: 2021

Guarantee: 'doc. RNDr. Roman Kubínek, CSc.'


  • Scanning tunneling microscopy (STM), AFM. Applications of SPM.

    Course review:

    • Scanning tunneling microscopy (STM)
    • Principles of atomic force microscopy (AFM) - contact, non-contact and tapping modes
    • MFM - Magnetic force microscopy
    • LFM - Lateral force microscopy and others scanning probe microscopy (SPM) techniques
    • SPM as a surface analytical tool
    • Environment of SPM methods
    • Scanners - constructions, defects, hardware and software correction, test of linearity of the scanner, cantilevers and tips
    • The artifacts of the images
    • Tip-surface convolution effect
    • Feedback artifacts
    • Possibilities of computer image analysis, testing of artifacts
    • Applications of SPM