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Course: Nanometrology

Department/Abbreviation: KEF/NMT

Year: 2020

Guarantee: 'Mgr. Milan Vůjtek, Ph.D.'

Annotation: Students obtain basic information about general metrology and standardization and deeper insight into metrology of nanostructures, especially in the field of length nanometrology.

Course review:
Metrology, standardization, uncertainty, metrological traceability Length nanometrology - problems connected with tiny sizes, metrological AFM, standards, evaluation, surface description Nanometrology of angle, mass, force and other quantities Quantum etalons of basic physical quantities