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Course: Advanced Microscopic Methods

Department/Abbreviation: KEF/MMMX

Year: 2021

Guarantee: 'doc. RNDr. Roman Kubínek, CSc.'

Annotation: Overwiev of various microsopy methods.

Course review:
Light microscopy - method of phase contrast, UV and IR microscopy, fluorescent microscopy, polarization microscopy, interference microscopy (Nomarski interference contrastm Hoffman modulation contrast), confocal laser microscopy, optical scanning near-field microscopy Electron microscopy - transmission electron microscopy, scanning electron microscopy, low-voltage electron microscopy, electron microscopy with high resolution, electron microscopy with optional vacuum (biological application) Scanning probe microscopy - scanning tunneling microscopy, atomic force microscopy, magnetic force microscopy, electrostatic force microscopy, lateral force microscopy, scanning capacity microscopy, scanning temperature microscopy, scanning optical near-field microscopy, methods related to the group of methods of scanning probe microscopy