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ASME

Course: Applications of Statistics in Metrology

Department/Abbreviation: KEF/ASME

Year: 2020

Guarantee: 'RNDr. Tomáš Rössler, Ph.D.'

Annotation: Characteristics of the statistical set with regard to use them in metrology. (

Course review:
Characteristics of the statistical set with regard to use them in metrology (distribution of stochastic quantity, distribution function and probability density, characteristics of position, variability, skewness and acuteness, normal, student and other metrologically important distribution of probability density)

  • Systematization of distribution functions (Pearson system, Johnson system and Burr system)
  • Regression analysis (selection of criteria of the best correspondence, selection of type of approximation function, least-square method, linearization of functions)
  • Introduction to the theory of errors and uncertainties (definition of an error and uncertainty, calculation of uncertainties, uncertainty of A type and B type, combined uncertainty, coefficient of extension, extended uncertainty)