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Pokročilé mikroskopické techniky


Course: Pokročilé mikroskopické techniky

Department/Abbreviation: KEF/NMIK

Year: 2018 2019

Guarantee: 'doc. RNDr. Roman Kubínek, CSc.'

Annotation: Light microscopy Near-field optical microscopy and selected super-resolution microscopic techniques. 4Pi microscopy, microscopy with structured illumination (SIM), microscopy using stimulated emission depletion (STED), and PALM, FPALM, STORM, methods for studying organic molecular formations. Electron microscopy TEM and SEM advanced techniques - TEM diffraction, TEM tomography, electron holography, HRTEM, WDS and EDS elemental chemical analysis using characteristic X-ray radiation. Combined scanning and transmission electron microscopy (STEM) technique to achieve high resolution (HRSTEM). Electron-Energy_Loss Spectrocopy (EELS) and Energy-Filtered TEM (EFTEM). EBSD methods for displaying polycrystalline material by backscattered electrons that yield high contrast polycrystalline grain grains and visualize high resolution local stress distribution and local deformation. Technique 4D EM - four-dimensional electron microscopy, ion microscopy, especially using He ions. Scanning Probe Microscopy (SPM) Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) in Contact, Noncontact and Tapping modes, Magnetic Force Microscopy (MFM), Lateral Force Microscopy (LFM), Modulated Force Microscopy (FMM), Electrostatic Force Microscopy (EFM), Kelvin microscopy, conductivity microscopy, transverse force microscopy (TDFM) and other SPM clones for the study of nanomaterials and nanostructures. Methods of electron lithography and lithographic techniques using SPM (atom manipulation, chemical reaction initiated by STM, nanoshaving and nanografting, self-organization of nanostructures induced by SPM, local anodic oxidation (LAO), constructive nanolithography (CNL), charge record, Dip-pen, enzymatically assisted lithography, AFM thermal lithography of polymers, magnetic and ferroelectric lithography, Atom Probe Tomography for the study of solids, with the possibility of achieving 3D chemical analysis with atomic resolution.

 

Přednáška
Nanoskopie

(PDF 6,9 MiB)

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Základy EM

(PDF 2,8 MiB)

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TEM - difrakční režim

(PDF 3,4 MiB)

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HRTEM, XEDS, EELS

(PDF 2,7 MiB)

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4D EM

(PDF 1,2 MiB)

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Pokročilá TEM

(PDF 2,2 MiB)

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Elektronová holografie

(PDF 1,5 MiB)

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Elektronová  litografie

(PDF 1,3 MiB)

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Kryoelektronová mikroskopie

(PDF 3,3 MiB)

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EBSD

(PDF 1,7 MiB)

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FIB

(PDF 1,1 MiB)

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Helium iontová mikroskopie

(PDF 4,6 MiB)

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Metody vylepšující rozlišení

(PDF 688 kiB)

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Superrozlišená SM

(PDF 3,0 MiB)

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(PDF 2,7 MiB)